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| No | Items | Description | ||
| 1 | Standard Process | Metal Etch : Cl2/HBr Gas Base | ||
| Nitride Etch : CF4 Gase Base | ||||
| Oxide Etch : CF4 Gas Base | ||||
| Special Etch : SiC, GaN, Polyimide Etc. | ||||
| 2 | Plasma Source | ICP Plasma (Plasma Density : >5X10_12/cm3) | ||
| 3 | Pressure Control | 5 mTorr ~ 100 mTor | ||
| 4 | Power | Source Power : 2000W(13.56MHz), Bias Power : 600W(13.56MHz) | ||
| 5 | Number of Gas | PM#2,3 (ICP) | Cl2, BCl3, CF4, SF6, Ar, O2 | |
| PM#6 (Ashing) | O2, N2 | |||
| 6 | Chuck Type | Elactrostatic Chuck | ||
| 7 | Process Temperature | Cathode 30℃(PM#2,3) / 200℃ (PM#6) | ||
| 8 | Wafer size | 8inch (Flat Type) | ||
| 9 | Control | Fully Automated Control Function | ||
| Semi-Auto Function for Wafer Transfer and Manual Process | ||||
【 직접사용 라이선스 대상자 목록 (유효기간 만료 및 자격정지자 제외) 】
